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Crystals, Oscillators, Resonators Supplier Part Number | Manufacturer Part Number | Price | Stock | Manufacturer | Description | Packaging | Series | Part Status | Logic Type | Supply Voltage | Number of Bits | Operating Temperature ... | Mounting Type | Package / Case | Supplier Device Package ... | ||||||||||||||
|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|
SN74F283NSRE4 | SN74F283NSRE4 | Leadtime 2-3 weeks | Texas Instruments | IC FULL ADDER 4BIT BIN 16SO | Tape & Reel (TR) | 74F | Obsolete | Binary Full Adder with Fast Carry | 4.5 V ~ 5.5 V | 4 | 0°C ~ 70°C | Surface Mount | 16-SOIC (0.209", 5.30mm Width) | 16-SO | |||||||||||||||
| SN74F283NSR | SN74F283NSR | Leadtime 2-3 weeks | Texas Instruments | IC FULL ADDER 4BIT BIN 16SO | Tape & Reel (TR) | 74F | Obsolete | Binary Full Adder with Fast Carry | 4.5 V ~ 5.5 V | 4 | 0°C ~ 70°C | Surface Mount | 16-SOIC (0.209", 5.30mm Width) | 16-SO | |||||||||||||||
SN74F283DR.jpg) | SN74F283DR | Leadtime 2-3 weeks | Texas Instruments | IC FULL ADDER 4BIT BIN 16-SOIC | Tape & Reel (TR) | 74F | Binary Full Adder with Fast Carry | 4.5 V ~ 5.5 V | 4 | 0°C ~ 70°C | Surface Mount | 16-SOIC (0.154", 3.90mm Width) | 16-SOIC | ||||||||||||||||
| SN74F283D | SN74F283D |
| Leadtime 2-3 weeks | Texas Instruments | IC FULL ADDER 4BIT BIN 16-SOIC | Tube | 74F | Active | Binary Full Adder with Fast Carry | 4.5 V ~ 5.5 V | 4 | 0°C ~ 70°C | Surface Mount | 16-SOIC (0.154", 3.90mm Width) | 16-SOIC | ||||||||||||||
| SN74F1056DR | SN74F1056DR |
| Leadtime 2-3 weeks | Texas Instruments | IC ARRAY BUS-TERM 8BIT 16-SOIC | Tape & Reel (TR) | 74F | Active | Schottky Barrier Diode Bus-Termination Array | - | 8 | 0°C ~ 70°C | Surface Mount | 16-SOIC (0.154", 3.90mm Width) | 16-SOIC | ||||||||||||||
| SN74F1056D | SN74F1056D |
| Leadtime 2-3 weeks | Texas Instruments | IC ARRAY BUS-TERM 8BIT 16-SOIC | Tube | 74F | Active | Schottky Barrier Diode Bus-Termination Array | - | 8 | 0°C ~ 70°C | Surface Mount | 16-SOIC (0.154", 3.90mm Width) | 16-SOIC | ||||||||||||||
SN74BCT8374ANTG4 | SN74BCT8374ANTG4 | Leadtime 2-3 weeks | Texas Instruments | IC SCAN TEST DEVICE W/FF 24-DIP | Tube | 74BCT | Obsolete | Scan Test Device with D-Type Edge-Triggered Flip-Flops | 4.5 V ~ 5.5 V | 8 | 0°C ~ 70°C | Through Hole | 24-DIP (0.300", 7.62mm) | 24-PDIP | |||||||||||||||
| SN74BCT8374ANT | SN74BCT8374ANT | Leadtime 2-3 weeks | Texas Instruments | IC SCAN TEST DEVICE W/FF 24-DIP | Tube | 74BCT | Obsolete | Scan Test Device with D-Type Edge-Triggered Flip-Flops | 4.5 V ~ 5.5 V | 8 | 0°C ~ 70°C | Through Hole | 24-DIP (0.300", 7.62mm) | 24-PDIP | |||||||||||||||
SN74BCT8374ADWRE4 | SN74BCT8374ADWRE4 | Leadtime 2-3 weeks | Texas Instruments | IC SCAN TEST DEVICE W/FF 24-SOIC | Tape & Reel (TR) | 74BCT | Obsolete | Scan Test Device with D-Type Edge-Triggered Flip-Flops | 4.5 V ~ 5.5 V | 8 | 0°C ~ 70°C | Surface Mount | 24-SOIC (0.295", 7.50mm Width) | 24-SOIC | |||||||||||||||
| SN74BCT8374ADWR | SN74BCT8374ADWR | Leadtime 2-3 weeks | Texas Instruments | IC SCAN TEST DEVICE W/FF 24-SOIC | Tape & Reel (TR) | 74BCT | Obsolete | Scan Test Device with D-Type Edge-Triggered Flip-Flops | 4.5 V ~ 5.5 V | 8 | 0°C ~ 70°C | Surface Mount | 24-SOIC (0.295", 7.50mm Width) | 24-SOIC | |||||||||||||||
| SN74BCT8374ADW | SN74BCT8374ADW |
| Leadtime 2-3 weeks | Texas Instruments | IC SCAN TEST DEVICE W/FF 24-SOIC | Tube | 74BCT | Active | Scan Test Device with D-Type Edge-Triggered Flip-Flops | 4.5 V ~ 5.5 V | 8 | 0°C ~ 70°C | Surface Mount | 24-SOIC (0.295", 7.50mm Width) | 24-SOIC | ||||||||||||||
| SN74BCT8373ANT | SN74BCT8373ANT | Leadtime 2-3 weeks | Texas Instruments | IC SCAN TEST DEVICE LATCH 24-DIP | Tube | 74BCT | Obsolete | Scan Test Device with D-Type Latches | 4.5 V ~ 5.5 V | 8 | 0°C ~ 70°C | Through Hole | 24-DIP (0.300", 7.62mm) | 24-PDIP | |||||||||||||||
| SN74BCT8373ADWRE4 | SN74BCT8373ADWRE4 | Leadtime 2-3 weeks | Texas Instruments | IC SCAN TEST DEVICE LATCH 24SOIC | Tape & Reel (TR) | 74BCT | Obsolete | Scan Test Device with D-Type Latches | 4.5 V ~ 5.5 V | 8 | 0°C ~ 70°C | Surface Mount | 24-SOIC (0.295", 7.50mm Width) | 24-SOIC | |||||||||||||||
| SN74BCT8373ADWR | SN74BCT8373ADWR | Leadtime 2-3 weeks | Texas Instruments | IC SCAN TEST DEVICE LATCH 24SOIC | Tape & Reel (TR) | 74BCT | Obsolete | Scan Test Device with D-Type Latches | 4.5 V ~ 5.5 V | 8 | 0°C ~ 70°C | Surface Mount | 24-SOIC (0.295", 7.50mm Width) | 24-SOIC | |||||||||||||||
| SN74BCT8373ADW | SN74BCT8373ADW |
| Leadtime 2-3 weeks | Texas Instruments | IC SCAN TEST DEVICE LATCH 24SOIC | Tube | 74BCT | Active | Scan Test Device with D-Type Latches | 4.5 V ~ 5.5 V | 8 | 0°C ~ 70°C | Surface Mount | 24-SOIC (0.295", 7.50mm Width) | 24-SOIC | ||||||||||||||
| SN74BCT8245ANTG4 | SN74BCT8245ANTG4 | Leadtime 2-3 weeks | Texas Instruments | IC SCAN TEST DEVICE TXRX 24-DIP | Tube | 74BCT | Obsolete | Scan Test Device with Bus Transceivers | 4.5 V ~ 5.5 V | 8 | 0°C ~ 70°C | Through Hole | 24-DIP (0.300", 7.62mm) | 24-PDIP | |||||||||||||||
| SN74BCT8245ANT | SN74BCT8245ANT | Leadtime 2-3 weeks | Texas Instruments | IC SCAN TEST DEVICE TXRX 24-DIP | Tube | 74BCT | Obsolete | Scan Test Device with Bus Transceivers | 4.5 V ~ 5.5 V | 8 | 0°C ~ 70°C | Through Hole | 24-DIP (0.300", 7.62mm) | 24-PDIP | |||||||||||||||
| SN74BCT8245ADWR | SN74BCT8245ADWR |
| Leadtime 2-3 weeks | Texas Instruments | IC SCAN TEST DEVICE TXRX 24-SOIC | Tape & Reel (TR) | 74BCT | Active | Scan Test Device with Bus Transceivers | 4.5 V ~ 5.5 V | 8 | 0°C ~ 70°C | Surface Mount | 24-SOIC (0.295", 7.50mm Width) | 24-SOIC | ||||||||||||||
| SN74BCT8245ADW | SN74BCT8245ADW |
| Leadtime 2-3 weeks | Texas Instruments | IC SCAN TEST DEVICE TXRX 24-SOIC | Tube | 74BCT | Active | Scan Test Device with Bus Transceivers | 4.5 V ~ 5.5 V | 8 | 0°C ~ 70°C | Surface Mount | 24-SOIC (0.295", 7.50mm Width) | 24-SOIC | ||||||||||||||
| SN74BCT8244ANTG4 | SN74BCT8244ANTG4 | Leadtime 2-3 weeks | Texas Instruments | IC SCAN TEST DEVICE BUFF 24-DIP | Tube | 74BCT | Obsolete | Scan Test Device with Buffers | 4.5 V ~ 5.5 V | 8 | 0°C ~ 70°C | Through Hole | 24-DIP (0.300", 7.62mm) | 24-PDIP | |||||||||||||||
| SN74BCT8244ANT | SN74BCT8244ANT | Leadtime 2-3 weeks | Texas Instruments | IC SCAN TEST DEVICE BUFF 24-DIP | Tube | 74BCT | Obsolete | Scan Test Device with Buffers | 4.5 V ~ 5.5 V | 8 | 0°C ~ 70°C | Through Hole | 24-DIP (0.300", 7.62mm) | 24-PDIP | |||||||||||||||
| SN74BCT8244ADWR | SN74BCT8244ADWR | Leadtime 2-3 weeks | Texas Instruments | IC SCAN TEST DEVICE BUFF 24-SOIC | Tape & Reel (TR) | 74BCT | Scan Test Device with Buffers | 4.5 V ~ 5.5 V | 8 | 0°C ~ 70°C | Surface Mount | 24-SOIC (0.295", 7.50mm Width) | 24-SOIC | ||||||||||||||||
| SN74BCT8244ADWE4 | SN74BCT8244ADWE4 |
| Leadtime 2-3 weeks | Texas Instruments | IC SCAN TEST DEVICE BUFF 24-SOIC | Tube | 74BCT | Active | Scan Test Device with Buffers | 4.5 V ~ 5.5 V | 8 | 0°C ~ 70°C | Surface Mount | 24-SOIC (0.295", 7.50mm Width) | 24-SOIC | ||||||||||||||
| SN74BCT8244ADW | SN74BCT8244ADW |
| Leadtime 2-3 weeks | Texas Instruments | IC SCAN TEST DEVICE BUFF 24-SOIC | Tube | 74BCT | Active | Scan Test Device with Buffers | 4.5 V ~ 5.5 V | 8 | 0°C ~ 70°C | Surface Mount | 24-SOIC (0.295", 7.50mm Width) | 24-SOIC | ||||||||||||||
| SN74BCT8240ANTG4 | SN74BCT8240ANTG4 | Leadtime 2-3 weeks | Texas Instruments | IC SCAN TEST DEVICE BUFF 24-DIP | Tube | 74BCT | Obsolete | Scan Test Device with Inverting Buffers | 4.5 V ~ 5.5 V | 8 | 0°C ~ 70°C | Through Hole | 24-DIP (0.300", 7.62mm) | 24-PDIP | |||||||||||||||
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